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Atomic Force Microscopy
Atomic Force Microscopy can effectively provide topographic information down to the Angstrom level. While the SEM provides superior resolution due to its use of an electron beam in a vacuum, the AFM can provide a three-dimensional map of the surface using a physical probe that is raster scanned across the surface. The position of the probe and the feedback signal are recorded and produce the image. One of the most unique aspects of Marshall's AFM is its attachment to a nano-manipulator. When used in combination with a nanomanipulator, the AFM allows the user to not only see the image on the screen, but to feel the sample's exact contours and permutations. In addition to work with the nano-manipulator, the AFM has other properties that it can elicit from the sample of interest through the use of specialty probes. Properties such as thermal and electrical conductivity, magnetic and electric field strength, and sample compliance can be obtained. These tools and others are utilized to aid in understanding nanomachines, nanotools and related elements through research in nanotechnology. Nanochemistry is an important component of our success and is being investigated by Dr. Michael L. Norton. Contact Norton Laboratories with your interests. For more information, send your questions to:
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